INDUSTRIAL PECVD SILICON NITRIDE: SURFACE AND BULK PASSIVATION OF SILICON WAFERS Saul Winderbaum1, Andres Cuevas2, Florence Chen2, Jason Tan2, Kathryn Hanton2, Daniel Macdonald2 andKristin Roth3Shamas...
AppliedSurfaceScience324(2015)152–159ContentslistsavailableatScienceDirectAppliedSurfaceSciencejournalhomepage:www.elsevier.com/locate/apsuscInvestigationofp-typenanocrystallinesiliconemittersforsilic...
PROGRESSINPHOTOVOLTAICS:RESEARCHANDAPPLICATIONSProg.Photovolt:Res.Appl.2005;13:551–569Publishedonline25April2005inWileyInterScience(www.interscience.wiley.com).DOI:10.1002/pip.611ResearchBulkandSurfac...
JournalofNon-CrystallineSolids297(2002)96–101Short-rangeorderinnon-stoichiometricamorphoussiliconoxynitrideandsilicon-richnitrideV.A.Gritsenkoaa,*,R.W.M.Kwokb,HeiWongc,J.B.XudInstituteofSemiconductorP...
SolarEnergyMaterials&SolarCells62(2000)89}95Amorphoussiliconandsilicongermaniummaterialsforhigh-e$ciencytriple-junctionsolarcellsXunmingDeng*,XianboLiao,SijinHan,HenryPovolny,PratimaAgarwalDepartm...
网络出版时间:2015-01-16 08:26网络出版地址:http://www.cnki.net/kcms/detail/31.1363.TQ.20150116.0826.016.html第30卷 第2期 2015年2月无 机 材 料 学 报Vol. 30No. 2Journal of Inorganic Materials Feb., 2015 Article ID: 1000-324X(20...
MULTISCALE I M A G E ENHANCEMENT USING THE LOGARITHMIC I M A G E PROCESSING MODELwhere p,(x, y)= L(p,-,(x, y)). This process is depicted in Fig. 1 . As the index i is increased the spatial resolution ...
scan CCD image with space-variantmotion blursabstractWhen the speeds of objects in a scene exceed the temporal resolution of the camera shutter, motion blurs will occur. Since objects are often moving...
ROBUST IMAGE RESTORATION BASED ON M-ESTIMATIONCONCEPT AND PARAMETRIC MODEL OF IMAGE SPECTRUMSviatoslav VoloshynovskiyState University “Lvivska polytechnika”, Faculty of Radio EngineeringS. Bandery st...